Exploring Scanning Probe Microscopy with MATHEMATICA, 2nd, Revised and Enlarged Edition

This new and completely updated edition features not only an accompanying CD-ROM, but also a new applications section, reflecting the many breakthroughs in the field over the last few years. It provides a complete set of computational models that describe the physical phenomena associated with atomic force microscopy, scanning tunneling microscopy, and related technologies. The result is both a solid professional reference and an advanced-level text, beginning with the basics and moving on to the latest techniques, experiments, and theory.

The self-contained presentation spares researchers valuable time spent hunting through the technical literature for the theoretical results required to understand the models presented. The MATHEMATICA code for
all the text, figures and tables is included on the CD-ROM, affording the freedom to change the parameters of specific problems as desired, or even modify the programs themselves to suit various modeling needs.

Changing the parameters and running the code will have the effect of automatically replacing the relevant figures and tables presented in the book.