Avand Danesh :: Conductive Atomic Force Microscope

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Conductive Atomic Force Microscope

Lanza

ISBN: 978-3-527-34091-0

Hardcover

270 pages

November 2017

This is an out of stock title.

This book is the first one to provide reference manual for researchers using CAFM in studying nanomaterials, which concentrates in the study of electronic properties of nanosctructured materials and devices at the nanoscale. It encompasses the description of novel strategies, configurations and setups based on CAFM that allow perform enhanced measurements.

Confidence. Motivation. Success.

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